Time-dependent spalling behavior of thermally grown oxide induced by room temperature interfacial deformation

The displacement of the thermally grown oxide in thermal barrier systems upon temperature cycling

Models that characterize the displacement instability of the thermally grown oxide (TGO) found in some thermal barrier systems are reviewed, consolidated and extended. It is demonstrated that the simulations are only consistent with the observations whenever the bond coat and TGO both undergo plastic deformation. The TGO yields at the peak temperature, during growth, while the bond coat yields ...

Thermally driven interfacial dynamics of metal/oxide bilayer nanoribbons.

Solid-solid interfacial processes greatly affect the performance of electronic and composite materials, but probing the dynamics of buried interfaces is challenging and often involves lengthy or invasive sample preparation. We show that bilayer nanoribbons-made here of tin dioxide and copper-are convenient structures for observing as-made interfaces as they respond to changing temperature in a ...

Adsorbate and thermally induced spin reorientation transition in low-temperature-grown Fe/Cu(001)

Underwater Superoleophobicity Induced by the Thickness of the Thermally Grown Porous Oxide Layer on C84400 Copper Alloy

The underwater contact angle behavior on oxide layers of varying thicknesses was studied. These oxide layers were grown by thermally oxidizing C84400 copper alloys in N2-0.75 wt.% O2 and N2-5 wt.% O2 gas mixtures at 650 °C. Characterization of the oxidized specimens was effected using X-ray diffraction, scanning electron microscope (SEM) and contact angle goniometer. The results from the X-ray ...

Thermally Induced Losses in Ultra-Cold Atoms Magnetically Trapped Near Room-Temperature Surfaces

We have measured magnetic trap lifetimes of ultra-cold Rb atoms at distances of 5-1000 μm from surfaces of conducting metals with varying resistivity. Good agreement is found with a theoretical model for losses arising from near-field magnetic thermal noise, confirming the complications associated with holding trapped atoms close to conducting surfaces. A dielectric surface (silicon) was found ...